high voltage led lamps doc. no : qw0905-lg2040/hv12-o-w54 rev. : a date : 26 - dec . - 2006 data sheet lg2040/hv12-o-w54 lead-free parts ligitek electronics co.,ltd. property of ligitek only pb
part selection and application information (ratings at 25 ambient) ? absolute maximum rating (ta=25) ? note:1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted 2.specifications are subject to change without notice package dimension directivity radiation part no material color spectral halfwidth nm forward current (ma) @12v viewing angle 2 1/2 (deg) emitted lens parameter operating temperature storage temperature lead soldering temperature 260 for 5 seconds(2.0mm from body) lg2040/hv12-o-w54 peak wave length pnm luminous lntensity (mcd) @12v reverse current ( a) vr=15v forward voltage reverse voltage -40 to +85 -40 to +100 greenunit v v remark min. max. min. typ. lg2040/hv12-o-w54 gap green 565306.0 12 8.020 max. green diffused 100 g 12 36 15 100%50% 75%25% -60 -30 100% 50% 25% 0 75% 60 0 30 ligitek electronics co.,ltd. property of ligitek only page 1/2 3.0 17.0 0.5 78.0 2.0 0.5 typ 25.0min 5.2 4.2 4.0 3.0 + - pyrocondensation cannula vf if= rl vcc-vf rl=1200ohms 20% vcc=12volts rl +vcc if
solderability test solder resistance test thermal shock test high temperature high humidity test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs low temperature storage test high temperature storage test operating life test test item the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) test condition this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. description mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard ligitek electronics co.,ltd. property of ligitek only part no. lg2040/hv12-o-w54 reliability test: page 2/2
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